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    可靠度科學技術研究中心 CREST, Chang Gung University
    • 首頁
    • 中心簡介
      • 主任介紹 Director
      • 主任的話 Message
      • 中心願景 Vision&Mission
      • 可靠度學程 Program
      • 獲獎 Awards
      • 組織架構 Organization
    • CReST談話
      • 中心季刊 Newsletter
      • 影像集 Album
    • 研究群
    • 實驗室核心
      • 設備 Equipment
      • 軟體 Software
      • 合作 Cooperation
    • 研究成果
    • 刊物
      • 著作 Book
      • 著作章節 Book chapters
      • 期刊 Journal Paper
      • 會議論文 Conference Paper
    • 聯絡
    • 網站導覽
    • 長庚大學
    • English
    • 中文 (台灣)
  • 長庚大學
    • English

    Performance evaluation of covalently functionalized carbon nano-tube polymer heat sink for ultra high power LED

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Performance evaluation of covalently functionalized carbon nano-tube polymer heat sink for ultra high power LED 閱讀全文 »

    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

    著作 Book

    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections 閱讀全文 »

    Electrical-thermal-stress coupled-field effect in SOI and partial SOI lateral power diode

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Electrical-thermal-stress coupled-field effect in SOI and partial SOI lateral power diode 閱讀全文 »

    Covalent functionalization of carbon nanotubes and their use in dielectric epoxy composites to improve heat dissipation

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Covalent functionalization of carbon nanotubes and their use in dielectric epoxy composites to improve heat dissipation 閱讀全文 »

    Development of a Sn-Ag-Cu solder reinforced with Ni-coated carbon nanotubes

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Development of a Sn-Ag-Cu solder reinforced with Ni-coated carbon nanotubes 閱讀全文 »

    Black’s equation for today’s ULSI interconnect electromigration (invited)

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Black’s equation for today’s ULSI interconnect electromigration (invited) 閱讀全文 »

    Automated wafer defect map generation for process yield improvement

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Automated wafer defect map generation for process yield improvement 閱讀全文 »

    Ensuring Accuracy in Optical and Electrical Measurement of Ultra-Bright LEDs during Reliability Test

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Ensuring Accuracy in Optical and Electrical Measurement of Ultra-Bright LEDs during Reliability Test 閱讀全文 »

    Contamination Assessment of Inductive Couple Plasma Etching Chamber under Mixture of Recipes using Statistical Method

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Contamination Assessment of Inductive Couple Plasma Etching Chamber under Mixture of Recipes using Statistical Method 閱讀全文 »

    On-chip RF energy harvesting circuit for image sensor

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    On-chip RF energy harvesting circuit for image sensor 閱讀全文 »

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    • 中心公告
    • 刊物 Publication
      • 著作 Book
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        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 期刊 Journal Paper
        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 趙自強 Dr. Chao TC
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 著作章節 Book chapters
    • 中心季刊 Newsletter
    • 影像集 Album

    近期文章 Recent Posts

    • Newsletter No.9 Jul. 2025
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    • Newsletter No.8 Mar.2024
    • 影片導覽 Video
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    標籤 Tags

    Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

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    E-Mail:crest@mail.cgu.edu.tw
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