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    可靠度科學技術研究中心 CREST, Chang Gung University
    • 首頁
    • 中心簡介
      • 主任介紹 Director
      • 主任的話 Message
      • 中心願景 Vision&Mission
      • 可靠度學程 Program
      • 獲獎 Awards
      • 組織架構 Organization
    • CReST談話
      • 中心季刊 Newsletter
      • 影像集 Album
    • 研究群
    • 實驗室核心
      • 設備 Equipment
      • 軟體 Software
      • 合作 Cooperation
    • 研究成果
    • 刊物
      • 著作 Book
      • 著作章節 Book chapters
      • 期刊 Journal Paper
      • 會議論文 Conference Paper
    • 聯絡
    • 網站導覽
    • 長庚大學
    • English
    • 中文 (台灣)
  • 長庚大學
    • English

    Study of humidity reliability of solid state lighting (Invited Talk)

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Study of humidity reliability of solid state lighting (Invited Talk) 閱讀全文 »

    Creep mitigation in Sn-Ag-Cu composite solder with Ni-coated carbon nanotubes

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Creep mitigation in Sn-Ag-Cu composite solder with Ni-coated carbon nanotubes 閱讀全文 »

    SoC and SoH Estimation of battery cell and modules for electric vehicles (Keynote Talk)

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    SoC and SoH Estimation of battery cell and modules for electric vehicles (Keynote Talk) 閱讀全文 »

    Estimation of SoC/SoH of cell and RUL of battery pack for EV Application (Invited Talk)

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Estimation of SoC/SoH of cell and RUL of battery pack for EV Application (Invited Talk) 閱讀全文 »

    Rapid light output degradation of GaN based packaged LED in the early stage of humidity test

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Rapid light output degradation of GaN based packaged LED in the early stage of humidity test 閱讀全文 »

    Applications of multi-walled carbon nanotube in electronic packaging

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Applications of multi-walled carbon nanotube in electronic packaging 閱讀全文 »

    Electromigration reliability of interconnections in RF low noise amplifier circuit

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Electromigration reliability of interconnections in RF low noise amplifier circuit 閱讀全文 »

    Microstructure and mechanical properties of CrN films fabricated by high power pulsed magnetron discharge plasma immersion ion implantation and deposition

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Microstructure and mechanical properties of CrN films fabricated by high power pulsed magnetron discharge plasma immersion ion implantation and deposition 閱讀全文 »

    Comparison of SOI and PSOI LDMOS using electrical-thermal-stress coupled field modeling

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Comparison of SOI and PSOI LDMOS using electrical-thermal-stress coupled field modeling 閱讀全文 »

    Ceramic Integration and Joining Technologies: From Macro to Nanoscale

    著作章節 Book chapters

    Ceramic Integration and Joining Technologies: From Macro to Nanoscale 閱讀全文 »

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    • 中心公告
    • 刊物 Publication
      • 著作 Book
      • 會議論文 Conference Paper
        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 期刊 Journal Paper
        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 趙自強 Dr. Chao TC
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 著作章節 Book chapters
    • 中心季刊 Newsletter
    • 影像集 Album

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    • Newsletter No.10 Apr. 2026

    標籤 Tags

    Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

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    E-Mail:crest@mail.cgu.edu.tw
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