Statistical distribution of Lithium-ion batteries useful life and its application for battery pack reliability.
Shuen-Lin Jeng, Cher Ming Tan, Ping-Chia Chen, “S […]
Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System.
Tan, C. M., Chen, H. H., Wu, J. P., Sangwan, V., Tsai,
Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices.
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Atomic drift-less electromigration model for submicron copper interconnects.
Adhikari, Aparna, Arijit Roy, and Cher Ming Tan. “
Atomic drift-less electromigration model for submicron copper interconnects. 閱讀全文 »
2022年度「全球前 2% 頂尖科學家與終身成就」陳始明教授
2022年度「全球前2%頂尖科學家榜單（World’s Top 2% Scientists）」於2
2022年度「全球前 2% 頂尖科學家與終身成就」陳始明教授 閱讀全文 »
2021年度「全球前 2% 頂尖科學家與終身成就」 陳始明教授
2021年度「全球前2%頂尖科學家榜單（World’s Top 2% Scientists）」於2
2021年度「全球前 2% 頂尖科學家與終身成就」 陳始明教授 閱讀全文 »
