An approach to statistical analysis of gate oxide breakdown mechanisms 期刊 Journal Paper An approach to statistical analysis of gate oxide breakdown mechanisms 閱讀全文 »
Reverse breakdown voltage measurement for power P+NN+ rectifier 期刊 Journal Paper Reverse breakdown voltage measurement for power P+NN+ rectifier 閱讀全文 »
Device level electrical-thermal-stress coupled-field modeling 期刊 Journal Paper Device level electrical-thermal-stress coupled-field modeling 閱讀全文 »
Device level electrical-thermal-stress coupled-field modeling 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Device level electrical-thermal-stress coupled-field modeling 閱讀全文 »
Reliability screening through electrical testing for press-fit alternator power diode in automotive application 期刊 Journal Paper Reliability screening through electrical testing for press-fit alternator power diode in automotive application 閱讀全文 »
Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications 期刊 Journal Paper Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications 閱讀全文 »
Device temperature and stress distributions in power diode – a finite element method 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Device temperature and stress distributions in power diode – a finite element method 閱讀全文 »
Reliability screening through electrical testing for press-fit alternator power diode in automotive application 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Reliability screening through electrical testing for press-fit alternator power diode in automotive application 閱讀全文 »
Thermally induced stress in partial SOI structure during high temperature processing 期刊 Journal Paper Thermally induced stress in partial SOI structure during high temperature processing 閱讀全文 »
New useful information from simple forward I-V measurement of a power diode 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming New useful information from simple forward I-V measurement of a power diode 閱讀全文 »
