In-situ Characterization of the Defect Density in Reduced Graphene Oxide under Electrical Stress Using Fluorescence Microscopy

Zequn Zeng, Preetpal Singh, Sharon Lim Xiaodai, Cher Ming Tan and Chorng Haur Sow “ In-situ Characterization of the Defect Density in Reduced Graphene Oxide under Electrical Stress Using Fluorescence Microscopy”, International Journal of Nanotechnology, International Journal of Nanotechnology 2020 Vol.17 No.1 10.1504/IJNT.2020.109350
Online publication date:: Thu, 03-Sep-2020