Comparative study of non-standard power diodes 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Comparative study of non-standard power diodes 閱讀全文 »
Using nanoparticles and carbon nanotubes to enhance the properties of a lead free solder 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Using nanoparticles and carbon nanotubes to enhance the properties of a lead free solder 閱讀全文 »
Transient electrical thermal analysis of ESD process using 3-D finite element method 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Transient electrical thermal analysis of ESD process using 3-D finite element method 閱讀全文 »
3D circuit model for 3D IC reliability study (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming 3D circuit model for 3D IC reliability study (invited) 閱讀全文 »
A holistic numerical modeling for interconnect electromigration 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming A holistic numerical modeling for interconnect electromigration 閱讀全文 »
Size effect in Cu nano-interconnects and its implication on electromigration 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Size effect in Cu nano-interconnects and its implication on electromigration 閱讀全文 »
Nano-tailoring of carbon nanotube as nano-fillers for composite materials applications 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Nano-tailoring of carbon nanotube as nano-fillers for composite materials applications 閱讀全文 »
Methodologies for size, and temperature dependent change of materials properties 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Methodologies for size, and temperature dependent change of materials properties 閱讀全文 »
Very high current density package level electromigration test for copper interconnects 期刊 Journal Paper Very high current density package level electromigration test for copper interconnects 閱讀全文 »
A bimodal 3-parameter lognormal mixture distribution for electromigration failures 期刊 Journal Paper A bimodal 3-parameter lognormal mixture distribution for electromigration failures 閱讀全文 »
