Strong Correlation between the Dynamic Chemical State and Product Profile of Carbon Dioxide Electroreduction.
Jiali Wang, Hsiao-Chien Chen*, Hui-Ying Tan, Cher Ming […]
期刊 Journal Paper
Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System.
Tan, C. M., Chen, H. H., Wu, J. P., Sangwan, V., Tsai,
Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices.
Tan, Cher-Ming. “Editorial for Special Issue on R
Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices. 閱讀全文 »
Atomic drift-less electromigration model for submicron copper interconnects.
Adhikari, Aparna, Arijit Roy, and Cher Ming Tan. “
Atomic drift-less electromigration model for submicron copper interconnects. 閱讀全文 »
Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System
Tan, C. M., Chen, H. H., Wu, J. P., Sangwan, V., Tsai,
Degradation dynamics of quantum dots in white LED applications
Chen, H. C., Shabir, A., Tan, C. M., Singh, P., & L
Degradation dynamics of quantum dots in white LED applications 閱讀全文 »
Effect of resistor tolerance on the performance of resistor network—An application of the statistical design of experiment
Pandey, Vimal Kant, and Cher Ming Tan. “Effect of