SoC and SoH Estimation of battery cell and modules for electric vehicles (Keynote Talk) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming SoC and SoH Estimation of battery cell and modules for electric vehicles (Keynote Talk) 閱讀全文 »
Estimation of SoC/SoH of cell and RUL of battery pack for EV Application (Invited Talk) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Estimation of SoC/SoH of cell and RUL of battery pack for EV Application (Invited Talk) 閱讀全文 »
Applications of Finite element Methods for Reliability Study of ULSI Interconnections (Invited Talk) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Applications of Finite element Methods for Reliability Study of ULSI Interconnections (Invited Talk) 閱讀全文 »
Effect of IC layout on the reliability of CMOS amplifiers 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Effect of IC layout on the reliability of CMOS amplifiers 閱讀全文 »
Applications of multi-walled carbon nanotube (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Applications of multi-walled carbon nanotube (invited) 閱讀全文 »
Performance evaluation of covalently functionalized carbon nano-tube polymer heat sink for ultra high power LED 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Performance evaluation of covalently functionalized carbon nano-tube polymer heat sink for ultra high power LED 閱讀全文 »
Black’s equation for today’s ULSI interconnect electromigration (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Black’s equation for today’s ULSI interconnect electromigration (invited) 閱讀全文 »
Automated wafer defect map generation for process yield improvement 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Automated wafer defect map generation for process yield improvement 閱讀全文 »
Ensuring Accuracy in Optical and Electrical Measurement of Ultra-Bright LEDs during Reliability Test 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Ensuring Accuracy in Optical and Electrical Measurement of Ultra-Bright LEDs during Reliability Test 閱讀全文 »
Contamination Assessment of Inductive Couple Plasma Etching Chamber under Mixture of Recipes using Statistical Method 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Contamination Assessment of Inductive Couple Plasma Etching Chamber under Mixture of Recipes using Statistical Method 閱讀全文 »
