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可靠度科學技術研究中心 CREST, Chang Gung University

期刊 Journal Paper

期刊 Journal Paper

Study of Interactions between a-Ta films and SiO2 under rapid thermal annealing

Bya0938724577 2004 年 2 月 25 日2021 年 3 月 4 日

Read More Study of Interactions between a-Ta films and SiO2 under rapid thermal annealingContinue

期刊 Journal Paper

Overcoming intrinsic weakness of ULSI metallization electromigration performances

Bya0938724577 2004 年 2 月 25 日2021 年 3 月 4 日

Read More Overcoming intrinsic weakness of ULSI metallization electromigration performancesContinue

期刊 Journal Paper

Identifying key parameters for risk based inspections (RBI)

Byidiotj2002dm 2004 年 1 月 1 日

Read More Identifying key parameters for risk based inspections (RBI)Continue

期刊 Journal Paper

Preparation and characterization of copper oxide thin films deposited by filtered cathodic vacuum arc

Byidiotj2002dm 2004 年 1 月 1 日

Read More Preparation and characterization of copper oxide thin films deposited by filtered cathodic vacuum arcContinue

期刊 Journal Paper

Non-destructive void size determination in copper metallization under passivation

Bya0938724577 2003 年 2 月 25 日

Read More Non-destructive void size determination in copper metallization under passivationContinue

期刊 Journal Paper

Temperature and stress distribution in the SOI structure during fabrication

Bya0938724577 2003 年 2 月 25 日

Read More Temperature and stress distribution in the SOI structure during fabricationContinue

期刊 Journal Paper

A new method for deposition of cubic Ta diffusion barrier for Cu metallization

Bya0938724577 2003 年 2 月 25 日

Read More A new method for deposition of cubic Ta diffusion barrier for Cu metallizationContinue

期刊 Journal Paper

Failure mechanisms of aluminum bond pad peeling during thermosonic bonding

Bya0938724577 2003 年 2 月 25 日

Read More Failure mechanisms of aluminum bond pad peeling during thermosonic bondingContinue

期刊 Journal Paper

Low temperature silicon wafer bonding by sol-gel processing

Byidiotj2002dm 2003 年 1 月 1 日

Read More Low temperature silicon wafer bonding by sol-gel processingContinue

期刊 Journal Paper

Methodology for customer’s focus build-in reliability

Byidiotj2002dm 2003 年 1 月 1 日

Read More Methodology for customer’s focus build-in reliabilityContinue

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標籤 Tags

Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

333323桃園市龜山區文化一路259號第二醫學大樓4樓
4th Floor, 2nd Medical Science Building, No.259, Wenhua 1st Rd., Guishan Dist., Taoyuan City 33302, Taiwan (R.O.C.)
TEL:886-3-2118800 ext 3872
E-Mail:crest@mail.cgu.edu.tw
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  • 首頁
  • 中心簡介
    • 主任介紹 Director
    • 主任的話 Message
    • 中心願景 Vision&Mission
    • 可靠度學程 Program
    • 獲獎 Awards
    • 組織架構 Organization
  • CReST談話
    • 中心季刊 Newsletter
    • 影像集 Album
  • 研究群
  • 實驗室核心
    • 設備 Equipment
    • 軟體 Software
    • 合作 Cooperation
  • 研究成果
  • 刊物
    • 著作 Book
    • 著作章節 Book chapters
    • 期刊 Journal Paper
    • 會議論文 Conference Paper
  • 聯絡
  • 網站導覽
  • 長庚大學
  • English
  • 中文 (台灣)
Search