Reliability Data Analysis 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Reliability Data Analysis 閱讀全文 »
QFD implementation in a discrete semiconductor industry 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming QFD implementation in a discrete semiconductor industry 閱讀全文 »
A reliability statistics perspective on the pitfalls of standard wafer-level electromigration accelerated test (SWEAT) 期刊 Journal Paper A reliability statistics perspective on the pitfalls of standard wafer-level electromigration accelerated test (SWEAT) 閱讀全文 »
Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis 閱讀全文 »
Analysis of electromigration test data 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Analysis of electromigration test data 閱讀全文 »
Effects of a thin flash layer on the diffusion of Cu, Ta, Si, and O in the Cu/TaN/SiO2/Si structures 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Effects of a thin flash layer on the diffusion of Cu, Ta, Si, and O in the Cu/TaN/SiO2/Si structures 閱讀全文 »
Metastability in tritiated amorphous silicon 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Metastability in tritiated amorphous silicon 閱讀全文 »
Backside copper contamination issues in CMOS integrated circuits 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Backside copper contamination issues in CMOS integrated circuits 閱讀全文 »
Microelectronic Yield, Reliability, and Advanced Packaging 著作 Book Microelectronic Yield, Reliability, and Advanced Packaging 閱讀全文 »
Reliability data analysis software development 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Reliability data analysis software development 閱讀全文 »
