New useful information from simple forward I-V measurement of a power diode 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming New useful information from simple forward I-V measurement of a power diode 閱讀全文 »
Low temperature Si-to-Si wafer bonding with Sol-Gel coating as intermediate layer 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Low temperature Si-to-Si wafer bonding with Sol-Gel coating as intermediate layer 閱讀全文 »
Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications 閱讀全文 »
Industry-university R&D collaboration: expectation and reality 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Industry-university R&D collaboration: expectation and reality 閱讀全文 »
Finite element modeling of residual mechanical stress in partial SOI structure due to wafer bonding processing 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Finite element modeling of residual mechanical stress in partial SOI structure due to wafer bonding processing 閱讀全文 »
Reliabiilty Analysis and Application with MATLAB (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Reliabiilty Analysis and Application with MATLAB (invited) 閱讀全文 »
Low temperature wafer bonding in medium vacuum 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Low temperature wafer bonding in medium vacuum 閱讀全文 »
Building empirical model through simulation a case study 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Building empirical model through simulation a case study 閱讀全文 »
Silicon-to-silicon wafer bonding by tempered sol-gel intermediate layer 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Silicon-to-silicon wafer bonding by tempered sol-gel intermediate layer 閱讀全文 »
Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) 閱讀全文 »
