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    可靠度科學技術研究中心 CREST, Chang Gung University
    • 首頁
    • 中心簡介
      • 主任介紹 Director
      • 主任的話 Message
      • 中心願景 Vision&Mission
      • 可靠度學程 Program
      • 獲獎 Awards
      • 組織架構 Organization
    • CReST談話
      • 中心季刊 Newsletter
      • 影像集 Album
    • 研究群
    • 實驗室核心
      • 設備 Equipment
      • 軟體 Software
      • 合作 Cooperation
    • 研究成果
    • 刊物
      • 著作 Book
      • 著作章節 Book chapters
      • 期刊 Journal Paper
      • 會議論文 Conference Paper
    • 聯絡
    • 網站導覽
    • 長庚大學
    • English
    • 中文 (台灣)
  • 長庚大學
    • English

    Newsletter No.7 Dec.2022

    中心季刊 Newsletter

    Newsletter No.7 Dec.2022 閱讀全文 »

    Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Tan, C. M., Chen, H. H., Wu, J. P., Sangwan, V., Tsai,

    Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System 閱讀全文 »

    Degradation dynamics of quantum dots in white LED applications

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Chen, H. C., Shabir, A., Tan, C. M., Singh, P., & L

    Degradation dynamics of quantum dots in white LED applications 閱讀全文 »

    Impact of visible light and humidity on the stability of high-power light emitting diode packaging material

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Shabir, Abdul, and Cher Ming Tan. “Impact of visi

    Impact of visible light and humidity on the stability of high-power light emitting diode packaging material 閱讀全文 »

    Effect of resistor tolerance on the performance of resistor network—An application of the statistical design of experiment

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Pandey, Vimal Kant, and Cher Ming Tan. “Effect of

    Effect of resistor tolerance on the performance of resistor network—An application of the statistical design of experiment 閱讀全文 »

    Electronic Reliability Analysis Under Radiation Environment

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Cher Ming Tan, Vimal Kant Pandey, Yueh Chiang, and Tsun

    Electronic Reliability Analysis Under Radiation Environment 閱讀全文 »

    Application of Gallium Nitride Technology in Particle Therapy Imaging

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    V. K. Pandey and C. M. Tan, “Application of Galli

    Application of Gallium Nitride Technology in Particle Therapy Imaging 閱讀全文 »

    Effect of 150 MeV protons on carbon nanotubes for fabrication of a radiation detector

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Pandey, Vimal Kant, Cher Ming Tan, Sunjin Kim, Preetpal

    Effect of 150 MeV protons on carbon nanotubes for fabrication of a radiation detector 閱讀全文 »

    Lineal Energy of Proton in Silicon by a microdosimetry Simulation.

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Yueh Chiang; Cher Ming Tan; Chuan-Jong Tung; Chung-Chi

    Lineal Energy of Proton in Silicon by a microdosimetry Simulation. 閱讀全文 »

    Statistical Method and Non-Destructive Analytical Tools in the Failure Analysis of LED Array
    ECS Journal of Solid State Science and Technology

    期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming

    Preetpal Singh, Cher Ming Tan Statistical Method and No

    Statistical Method and Non-Destructive Analytical Tools in the Failure Analysis of LED Array
    ECS Journal of Solid State Science and Technology
    閱讀全文 »

    ← Previous 1 ... 4 5 6 ... 55 Next →
    • 中心公告
    • 刊物 Publication
      • 著作 Book
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        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 期刊 Journal Paper
        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 趙自強 Dr. Chao TC
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 著作章節 Book chapters
    • 中心季刊 Newsletter
    • 影像集 Album

    近期文章 Recent Posts

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    • 恭賀陳始明教授連續5年榮獲「全球前2%頂尖科學家榜單」殊榮
    • Newsletter No.8 Mar.2024
    • 影片導覽 Video
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    標籤 Tags

    Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

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