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    可靠度科學技術研究中心 CREST, Chang Gung University
    • 首頁
    • 中心簡介
      • 主任介紹 Director
      • 主任的話 Message
      • 中心願景 Vision&Mission
      • 可靠度學程 Program
      • 獲獎 Awards
      • 組織架構 Organization
    • CReST談話
      • 中心季刊 Newsletter
      • 影像集 Album
    • 研究群
    • 實驗室核心
      • 設備 Equipment
      • 軟體 Software
      • 合作 Cooperation
    • 研究成果
    • 刊物
      • 著作 Book
      • 著作章節 Book chapters
      • 期刊 Journal Paper
      • 會議論文 Conference Paper
    • 聯絡
    • 網站導覽
    • 長庚大學
    • English
    • 中文 (台灣)
  • 長庚大學
    • English

    Mechanical properties of Zirconia Thin Films deposited by filtered cathodic vacuum arc

    期刊 Journal Paper

    Mechanical properties of Zirconia Thin Films deposited by filtered cathodic vacuum arc 閱讀全文 »

    Feasibility of capacitive coupling voltage contrast (CCVC) for the failure analysis of advanced printed circuit board

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Feasibility of capacitive coupling voltage contrast (CCVC) for the failure analysis of advanced printed circuit board 閱讀全文 »

    Sol-gel coating facilitating Si-to-Si wafer bonding at low temperature

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Sol-gel coating facilitating Si-to-Si wafer bonding at low temperature 閱讀全文 »

    Examine the impact of maintenance policy for predictive maintenance

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Examine the impact of maintenance policy for predictive maintenance 閱讀全文 »

    New analysis technique for time to failure data in copper electromigration

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    New analysis technique for time to failure data in copper electromigration 閱讀全文 »

    Effect of high voltage annealing on the field emission of multi-walled carbon nanotube film

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Effect of high voltage annealing on the field emission of multi-walled carbon nanotube film 閱讀全文 »

    Device temperature and stress distributions in power diode – a finite element method

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Device temperature and stress distributions in power diode – a finite element method 閱讀全文 »

    Reliability screening through electrical testing for press-fit alternator power diode in automotive application

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Reliability screening through electrical testing for press-fit alternator power diode in automotive application 閱讀全文 »

    Making wafer bonding viable for mass production

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Making wafer bonding viable for mass production 閱讀全文 »

    Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist

    刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming

    Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist 閱讀全文 »

    ← Previous 1 ... 46 47 48 ... 55 Next →
    • 中心公告
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        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 期刊 Journal Paper
        • 陳始明 Dr. Tan, Cher Ming
        • 高瑄苓 Dr. Kao,Hsuan-Ling
        • 李坤穆 Dr. Kun-Mu Lee
        • 趙自強 Dr. Chao TC
        • 陳効謙 Dr. Hsiao-Chien Chen
      • 著作章節 Book chapters
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    近期文章 Recent Posts

    • Newsletter No.9 Jul. 2025
    • 恭賀陳始明教授連續5年榮獲「全球前2%頂尖科學家榜單」殊榮
    • Newsletter No.8 Mar.2024
    • 影片導覽 Video
    • 2023.09.05 臺灣可靠度協會籌備會

    標籤 Tags

    Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

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    E-Mail:crest@mail.cgu.edu.tw
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