A methodology for studying the effect of overcharge on the safety of lithium-ion batteries 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming A methodology for studying the effect of overcharge on the safety of lithium-ion batteries 閱讀全文 »
Ab initio simulation of electronic and mechanical properties of aluminium for fatigue early feature investigation 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Shuai Zhang, Cher Ming Tan, Shuguang Cheng, Tianqi Deng Ab initio simulation of electronic and mechanical properties of aluminium for fatigue early feature investigation 閱讀全文 »
Copper Catalyzed Crystallization of Amorphous Carbon into Graphene 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Copper Catalyzed Crystallization of Amorphous Carbon into Graphene 閱讀全文 »
Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test 閱讀全文 »
Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction 閱讀全文 »
Methodology of reliability enhancement for high power LED driver 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Methodology of reliability enhancement for high power LED driver 閱讀全文 »
Modeling and analysis of gate-all-around silicon nanowire FET 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Modeling and analysis of gate-all-around silicon nanowire FET 閱讀全文 »
A practical framework of electrical based online state-of-charge estimation of lithium ion batteries 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming A practical framework of electrical based online state-of-charge estimation of lithium ion batteries 閱讀全文 »
Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions 閱讀全文 »
Extending electromigration modeling from test structures to Integrated circuit layout level 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Extending electromigration modeling from test structures to Integrated circuit layout level 閱讀全文 »
