Automated wafer defect map generation for process yield improvement 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Automated wafer defect map generation for process yield improvement 閱讀全文 »
Identifying key parameters for risk based inspections (RBI) 期刊 Journal Paper Identifying key parameters for risk based inspections (RBI) 閱讀全文 »
Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) 閱讀全文 »
Methodology for customer’s focus build-in reliability 期刊 Journal Paper Methodology for customer’s focus build-in reliability 閱讀全文 »
QFD implementation in a discrete semiconductor industry 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming QFD implementation in a discrete semiconductor industry 閱讀全文 »
A new quality control parameter in wafer fabrication for wire bonding integrity 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming A new quality control parameter in wafer fabrication for wire bonding integrity 閱讀全文 »
Integrating device modeling in QFD implementation for power electronics applications 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Integrating device modeling in QFD implementation for power electronics applications 閱讀全文 »
Computerization of quality control in electronics components industry 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Computerization of quality control in electronics components industry 閱讀全文 »
