Statistical modeling of via redundancy effects on interconnect reliability
N. Raghavan and C. M. Tan. “Statistical modeling of via redundancy effects on interconnect reliability,” in IEEE Int. Conf. on Physical and Failure Analysis, 2008.
N. Raghavan and C. M. Tan. “Statistical modeling of via redundancy effects on interconnect reliability,” in IEEE Int. Conf. on Physical and Failure Analysis, 2008.