刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited)

C. M. Tan. “Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited),” presented at Int. Quality and Process control Conf., Bangkok, Jan. 2004.