EOS Failure Analysis and Root Cause Identification of Schottky Barrier Rectifiers through Finite Element Modelling

Udit Narula & Cher Ming Tan, “EOS Failure Analysis and Root Cause Identification of Schottky Barrier Rectifiers through Finite Element Modelling”, Taiwan ESD and Reliability Conference, Hsinchu, Taiwan, 1st-3rd November 2017.