Effect of Body Bias and Temperature on Low-Frequency Noise in 40-nm nMOSFETs

H.-C. Chiu, M.-L. Chou, C.-H. Cheng, H.-L. Kao*, and C.-L. Cho, “Effect of Body Bias and Temperature on Low-Frequency Noise in 40-nm nMOSFETs,” Microelectronics Reliability, vol. 78, 2017, pp. 267-271. 2017/9/1