Device level electrical-thermal-stress coupled-field modeling
G. Huang and C. M. Tan. “Device level electrical-thermal-stress coupled-field modeling,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2006.
G. Huang and C. M. Tan. “Device level electrical-thermal-stress coupled-field modeling,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2006.
