Degradation behavior of high power light emitting diode under high frequency switching

S. H. Chen, C. M. Tan, G. H. Tan, and F. He. “Degradation behavior of high power light emitting diode under high frequency switching,” Microelectronics Reliability, vol. 52, no. 9-10, pp. 2168-2173, Sep.-Oct. 2012.
https://www.sciencedirect.com/science/article/pii/S0026271412002661