Damage Threshold Determination and Non-destructive Identification of Possible Failure Sites in PIN Limiter

Cher Ming Tan and Wenzhi Yu, “Damage Threshold Determination and Non-destructive Identification of Possible Failure Sites in PIN Limiter”, Microelectronics Reliability, vol. 54, no. 5, pp. 960-964, May 2014
https://www.sciencedirect.com/science/article/pii/S0026271414000134