刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Challenges in Reliability Screening for High Power Diodes

Udit Narula, Cher Ming Tan, “Challenges in Reliability Screening for High Power Diodes”, 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017), Chengdu, China, 4-7 July, 2017.

著作章節 Book chapters

Simulated Annealing for Mixture Distribution Analysis and its Applications to Reliability Testing

Byidiotj2002dm 2008 年 1 月 1 日2021 年 3 月 9 日

期刊 Journal Paper

Investigation of weight-on-wheel switch failure in F-16 aircraft

Bya0938724577 2005 年 2 月 25 日

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Overcoming intrinsic weakness of ULSI metallization on electromigration performances

Byidiotj2002dm 2003 年 1 月 1 日2021 年 4 月 14 日

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Effects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for ultra high power light-emitting diode

Byidiotj2002dm 2013 年 1 月 2 日2021 年 4 月 14 日

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

A possible reality on battery-less low-power portable electronics

Byidiotj2002dm 2010 年 1 月 1 日2021 年 4 月 14 日

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Extrapolation of electromigration reliability assessment from accelerated test for submicron interconnect via structure

Byidiotj2002dm 2005 年 1 月 1 日2021 年 4 月 14 日