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可靠度科學技術研究中心 CREST, Chang Gung University

刊物 Publication

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

A comprehensive semi-empirical mobility model for strained-Si N-MOSFETs

Byidiotj2002dm 2006 年 1 月 1 日2021 年 4 月 14 日

Read More A comprehensive semi-empirical mobility model for strained-Si N-MOSFETsContinue

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

A comprehensive predictive maintenance model for equipment maintenance in the semiconductor industry

Byidiotj2002dm 2006 年 1 月 1 日2021 年 4 月 14 日

Read More A comprehensive predictive maintenance model for equipment maintenance in the semiconductor industryContinue

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

A cost model for the predictive maintenance policy of a multi-state system

Byidiotj2002dm 2006 年 1 月 1 日2021 年 4 月 14 日

Read More A cost model for the predictive maintenance policy of a multi-state systemContinue

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Predictive maintenance and its impact to business decision (invited)

Byidiotj2002dm 2005 年 12 月 1 日2021 年 4 月 14 日

Read More Predictive maintenance and its impact to business decision (invited)Continue

刊物 Publication | 會議論文 Conference Paper | 陳始明 Dr. Tan, Cher Ming

Maintenance policy for predictive maintenance (invited)

Byidiotj2002dm 2005 年 12 月 1 日2021 年 4 月 14 日

Read More Maintenance policy for predictive maintenance (invited)Continue

期刊 Journal Paper

Investigation of weight-on-wheel switch failure in F-16 aircraft

Bya0938724577 2005 年 2 月 25 日

Read More Investigation of weight-on-wheel switch failure in F-16 aircraftContinue

期刊 Journal Paper

Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist

Bya0938724577 2005 年 2 月 25 日

Read More Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resistContinue

期刊 Journal Paper

Mathematical model for low-temperature wafer bonding under medium vacuum and its application

Bya0938724577 2005 年 2 月 25 日

Read More Mathematical model for low-temperature wafer bonding under medium vacuum and its applicationContinue

期刊 Journal Paper

Reliability screening through electrical testing for press-fit alternator power diode in automotive application

Bya0938724577 2005 年 2 月 25 日

Read More Reliability screening through electrical testing for press-fit alternator power diode in automotive applicationContinue

期刊 Journal Paper

Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications

Bya0938724577 2005 年 2 月 25 日

Read More Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applicationsContinue

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標籤 Tags

Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

333323桃園市龜山區文化一路259號第二醫學大樓4樓
4th Floor, 2nd Medical Science Building, No.259, Wenhua 1st Rd., Guishan Dist., Taoyuan City 33302, Taiwan (R.O.C.)
TEL:886-3-2118800 ext 3872
E-Mail:crest@mail.cgu.edu.tw
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  • 首頁
  • 中心簡介
    • 主任介紹 Director
    • 主任的話 Message
    • 中心願景 Vision&Mission
    • 可靠度學程 Program
    • 獲獎 Awards
    • 組織架構 Organization
  • CReST談話
    • 中心季刊 Newsletter
    • 影像集 Album
  • 研究群
  • 實驗室核心
    • 設備 Equipment
    • 軟體 Software
    • 合作 Cooperation
  • 研究成果
  • 刊物
    • 著作 Book
    • 著作章節 Book chapters
    • 期刊 Journal Paper
    • 會議論文 Conference Paper
  • 聯絡
  • 網站導覽
  • 長庚大學
  • English
  • 中文 (台灣)
Search