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可靠度科學技術研究中心 CREST, Chang Gung University

高瑄苓 Dr. Kao,Hsuan-Ling

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

The Characteristics of 6-inch GaN on Si RF HEMT with High Isolation Composited Buffer Layer Design

ByJames 2021 年 1 月 1 日2021 年 4 月 13 日

Read More The Characteristics of 6-inch GaN on Si RF HEMT with High Isolation Composited Buffer Layer DesignContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

Normally-off p-GaN Gated AlGaN/GaN HEMTs Using Plasma Oxidation Technique in Access Region

ByJames 2020 年 8 月 1 日2021 年 4 月 13 日

Read More Normally-off p-GaN Gated AlGaN/GaN HEMTs Using Plasma Oxidation Technique in Access RegionContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

A Fully Inkjet-Printed Strain Sensor Based on Carbon Nanotubes

ByJames 2020 年 8 月 1 日2021 年 4 月 13 日

Read More A Fully Inkjet-Printed Strain Sensor Based on Carbon NanotubesContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

High Threshold Voltage Normally-off Ultra-Thin-Barrier GaN MISHEMT with MOCVD-Regrown Ohmics and Si-rich LPCVD-SiNx Gate Insulator

ByJames 2020 年 5 月 1 日2021 年 4 月 13 日

Read More High Threshold Voltage Normally-off Ultra-Thin-Barrier GaN MISHEMT with MOCVD-Regrown Ohmics and Si-rich LPCVD-SiNx Gate InsulatorContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

AlGaN/GaN High-Electron-Mobility Transistors on a Silicon Substrate Under Uniaxial Tensile Strain

ByJames 2020 年 5 月 1 日2021 年 4 月 13 日

Read More AlGaN/GaN High-Electron-Mobility Transistors on a Silicon Substrate Under Uniaxial Tensile StrainContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

Mechanical Tensile Strain for AlGaN/GaN Metal-Insulator-Semiconductor High-Electron-Mobility Transistors on a Silicon-on-Insulator Substrate

ByJames 2020 年 4 月 1 日2021 年 4 月 13 日

Read More Mechanical Tensile Strain for AlGaN/GaN Metal-Insulator-Semiconductor High-Electron-Mobility Transistors on a Silicon-on-Insulator SubstrateContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

Analysis of the Back-barrier Effect in AlGaN/GaN High Electron Mobility Transistor on Free-standing GaN Substrates

ByJames 2020 年 1 月 1 日2021 年 4 月 13 日

Read More Analysis of the Back-barrier Effect in AlGaN/GaN High Electron Mobility Transistor on Free-standing GaN SubstratesContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

On-Chip GaN-on-SiC VCO Using a Tunable Substrate Integrated Waveguide Loaded With Complementary Split Ring Resonator

ByJames 2019 年 8 月 1 日2021 年 4 月 13 日

Read More On-Chip GaN-on-SiC VCO Using a Tunable Substrate Integrated Waveguide Loaded With Complementary Split Ring ResonatorContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

Dynamic Behavior Improvement of Normally-Off p-GaN High-Electron-Mobility Transistor Through a Low-Temperature Microwave Annealing Process

ByJames 2019 年 7 月 1 日2021 年 4 月 13 日

Read More Dynamic Behavior Improvement of Normally-Off p-GaN High-Electron-Mobility Transistor Through a Low-Temperature Microwave Annealing ProcessContinue

期刊 Journal Paper | 高瑄苓 Dr. Kao,Hsuan-Ling

The demonstration of recessed anodes AlGaN/GaN Schottky barrier diodes using microwave cyclic plasma oxidation/wet etching techniques

ByJames 2019 年 7 月 1 日2021 年 4 月 13 日

Read More The demonstration of recessed anodes AlGaN/GaN Schottky barrier diodes using microwave cyclic plasma oxidation/wet etching techniquesContinue

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Battery (15) Devices Reliability (27) Electromagnetics (10) Failure Analysis (16) General Reliability (3) Integrated Circuit Reliability (13) Interconnects Reliability (80) LED Reliability (36) Memory (1) Nanotechnology (46) Others (32) Predictive Maintenance (3) Predictive Maintenance/ Prognosis and Health Mgt (7) Prognosis and Health Mgt (16) Quality (8) Quantitative Service Reliability Assessment on Single and Multi Layer Networks (5) Radiation (7) Reliability Statistics (12) Remanufacturing (2) Theory and Practice of Quality and Reliability Engineering in Asia Industry (2) Wafer Bonding (19)

333323桃園市龜山區文化一路259號第二醫學大樓4樓
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