Non-destructive Degradation Study of Copper Wire Bond for Its Temperature Cycling Reliability Evaluation 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Non-destructive Degradation Study of Copper Wire Bond for Its Temperature Cycling Reliability Evaluation 閱讀全文 »
Dependence of test conditions on humidity reliability results for high power LEDs 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Dependence of test conditions on humidity reliability results for high power LEDs 閱讀全文 »
Thermally Stressed Copper Induced Synthesis of Graphene using Amorphous Carbon 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Thermally Stressed Copper Induced Synthesis of Graphene using Amorphous Carbon 閱讀全文 »
A reliability based design concept for lithium-ion battery pack in electric vehicles 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming A reliability based design concept for lithium-ion battery pack in electric vehicles 閱讀全文 »
Exploring the Humidity Effect on the Reliability of High Power LEDs 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Exploring the Humidity Effect on the Reliability of High Power LEDs 閱讀全文 »
A methodology for studying the effect of overcharge on the safety of lithium-ion batteries 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming A methodology for studying the effect of overcharge on the safety of lithium-ion batteries 閱讀全文 »
Copper Catalyzed Crystallization of Amorphous Carbon into Graphene 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Copper Catalyzed Crystallization of Amorphous Carbon into Graphene 閱讀全文 »
Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test 閱讀全文 »
Extending electromigration modeling from test structures to Integrated circuit layout level 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Extending electromigration modeling from test structures to Integrated circuit layout level 閱讀全文 »
Real Time Monitoring and Characterizing of Li-ion Batteries Aging 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Real Time Monitoring and Characterizing of Li-ion Batteries Aging 閱讀全文 »
