Humidity study of a-Si PV cell 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Humidity study of a-Si PV cell 閱讀全文 »
Circuit level interconnect reliability study using 3D circuit model 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Circuit level interconnect reliability study using 3D circuit model 閱讀全文 »
Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model 閱讀全文 »
Hot carrier reliability of power SOI EDNMOS 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Hot carrier reliability of power SOI EDNMOS 閱讀全文 »
Width dependence of the effectiveness of reservoir length in improving electromigration for Cu/low-K interconnects 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Width dependence of the effectiveness of reservoir length in improving electromigration for Cu/low-K interconnects 閱讀全文 »
Addressing the challenges in solder resistance measurement for electromigration test 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Addressing the challenges in solder resistance measurement for electromigration test 閱讀全文 »
Electromigration performance of through silicon via (TSV) – A modeling approach 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Electromigration performance of through silicon via (TSV) – A modeling approach 閱讀全文 »
Analysis of humidity effects on the degradation of high-power white LEDs 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Analysis of humidity effects on the degradation of high-power white LEDs 閱讀全文 »
A framework to practical predictive maintenance modeling for multi-state systems 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming A framework to practical predictive maintenance modeling for multi-state systems 閱讀全文 »
Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI) 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI) 閱讀全文 »
