Interfacial reaction and shear strength of Ni-coated carbon nanotubes refinforced Sn-Ag-Cu solder joints during thermal cycling 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Interfacial reaction and shear strength of Ni-coated carbon nanotubes refinforced Sn-Ag-Cu solder joints during thermal cycling 閱讀全文 »
Integration of Low-k Dielectric Liner in Through Silicon Via and Thermomechanical Stress Relief 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Integration of Low-k Dielectric Liner in Through Silicon Via and Thermomechanical Stress Relief 閱讀全文 »
3D simulation-based research on the effect of interconnect structures on circuit reliability 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming 3D simulation-based research on the effect of interconnect structures on circuit reliability 閱讀全文 »
Degradation behavior of high power light emitting diode under high frequency switching 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Degradation behavior of high power light emitting diode under high frequency switching 閱讀全文 »
Comparison of electromigration simulation in test structure and actual circuit 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Comparison of electromigration simulation in test structure and actual circuit 閱讀全文 »
Reliability study of LED driver – a case study of black box testing 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Reliability study of LED driver – a case study of black box testing 閱讀全文 »
Effect of Ni-Coated Carbon Nanotubes on Interfacial Reaction and Shear Strength of Sn-Ag-Cu Solder Joints 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Effect of Ni-Coated Carbon Nanotubes on Interfacial Reaction and Shear Strength of Sn-Ag-Cu Solder Joints 閱讀全文 »
Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test 閱讀全文 »
Effect of IC layout on the reliability of CMOS amplifiers 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Effect of IC layout on the reliability of CMOS amplifiers 閱讀全文 »
Applications of Finite element Methods for Reliability Study of ULSI Interconnections 期刊 Journal Paper, 陳始明 Dr. Tan, Cher Ming Applications of Finite element Methods for Reliability Study of ULSI Interconnections 閱讀全文 »
