Application of wigner-ville distribution in electromigration noise analysis

C. M. Tan and S. Y. Lim. “Application of wigner-ville distribution in electromigration noise analysis,” IEEE Transactions on Device and Materials Reliability, vol. 2, no. 2, pp. 30-35, 2002
https://ieeexplore.ieee.org/abstract/document/1030873

Determining the Parameters of Importance of a Graphene Synthesis Process Using Design-of-Experiments Method

High Performance InAlN/GaN/Si High Electron Mobility Transistor Using Microwave Ohmic Annealing Technique

Tracking the in situ generation of hetero-metal-metal bonds in phosphide electrocatalysts for electrocatalytic hydrogen evolution.

Dynamic simulation of electromigration in polycrystalline interconnect thin film using combined Monte Carlo algorithm and finite element modeling

Electrical instability of InGaZnO thin-film transistors with and without titanium sub-oxide layer under light illumination

Degradation dynamics of quantum dots in white LED applications.

瀏覽人數

Similar Posts

瀏覽人數