設備 Equipment

Confocal Scanning Acoustic microscope(C-SAM) PVA TePla AG

規格 Specification:

• Analysis of samples in the ultrasound frequency range up to 400 MHz
• Designed by default for a transducer
• Equipped with a graphical user interface for ease of operation and flexible applicability
• The sample bath and the scanner can be adapted to customer requirements.
• Scanning range: x = 320 mm; y = 320 mm
• Optional 2.5 giga-sample/5 giga-sample ADC
• Smallest pixel size 0.5 μm
• 1 giga-sample ADC

Scanning Electron Microscope JSM-IT200 InTouchScopeTM

功能 Function:

• Material Analysis

規格 Specification:

• Operation Guided by Specimen Exchange Navi
• Seamless transition from optical image to SEM image
• Preset multiple analysis positions across specimen set
• Live analysis-displaying x-ray spectrum and main constituent elements with elements of interest.
• Faster Report Generation with SMILE VIEW TM Lab.

Ultimaker S3 3D Printer

規格 Specification:

• Network connectivity: Print via Wi-Fi, LAN, cloud, or with USB
• Touch screen: Effortless operation via an award-winning user interface
• Advanced active leveling: Reliable first-layer adhesion, enables unattended use
• Front enclosure: Improved printing environment for better print results
• Flow sensor: Stay informed when filament runs out to increase print success
• Composite materials compatible: Print parts with high strength and unique properties
• Easy setup and monitoring: With NFC material recognition and internal camera

TBLC08 LISN

規格 Specification:

• Frequency range: 9 kHz to 30 MHz
• Impedance: 50 Ω ║ (50 µH + 5 Ω)
• Artificial hand: 220 pF + 511 Ω
• Switchable PE: 50 Ω ║ 50 µH
• Limiter / attenuator: 150 kHz to 30 MHz; 10 dB
• Air core inductors
• Line voltage: max. 240V / 50 – 60 Hz, CAT
• DUT socket: country specific
• Measurement connector: 50 Ω BNC
• Power connector: IEC 60320 C13
• Operating Temperature Range:+5°C+40°C;5% to 80% RH
• Safety: Safety Class I, IEC 1010-01​

Decapsulation System Teltec Semiconductor Pacific Limited

功能 Function:

• Spectrum Two FTIR

規格 Specification:

• Flexible Etch Time: 1 – 1800 seconds
• One-hundred (100) Etch Recipe Storage
• Wide Temperature Range: 20°C – 250°C
• Thirteen (13) Mixed-acid Ratios
• Wide Range of Etchant Acid Volumes: 1 mL/min – 10 mL/min
• Pulse etching enabling rapid decapping with minimal acid consumption
• Wide range of user selectable acid mix ratios
• Ability to perform multi-step decapsulation processes

規格 Specification:

• Raman Excitation source: 457nm SLM laser, 50mW
• High sensitivity Raman Spectrograph (4 gratings)
• High sensitivity TE Cooled CCD detector (2000×256 pixels)
• Spectral Range : 200-1050nm

規格 Specification:

• SPM Sample Scanning range: 85 micron x 85 micron; SPM Probe Scanning range: 30 micron x 30 micron
• Supports a variety of standard AFM/SPM imaging modes. Image and line profiles displayed in real time.

Reliability Test System-Cascade Microtech 1164

功能 Function:

• IC reliability test

規格 Specification:

• Provide a full range of test applications – EM, SM, BTS, TDDB, SILC, MTTDDB, HCI, and BTI.
• A single system can run any combination of these test applications simultaneously.
• The system can perform package-level reliability and / or wafer-level reliability.
• Independent notebook ovens provide many concurrent (simultaneous) temperatures for package-level reliability.

4200-SCS Semiconductor Characterization Technology System

功能 Function:

• Semiconductor characteristic test

規格 Specification:

• Provide four 4225-PMU four SMU systems, provide 8 channels to support the traditional pulse mode
• Arbitrary waveform mode (ARB), each pulse channel contains an embedded high durability output relay (solid state relay)
• Ultra-flexible and versatile system for a wide range of parametric tests including very low-level DC measurements, CV and ultra-fast IV for pulse and transient tests

Thermal Image Analysis System for Regional Telemetry Temperature

功能 Function:

• Thermal image analysis

規格 Specification:

• Regional emissivity correction
• Automatically calculate the total area of the emissivity
• Zoom and rotate 90 degrees to store and analyze
• Multi-point temperature display and annotation
• Zone temperature curve
• Automatic thermal analysis and other analyses
• Zone resistance analysis
• Three-dimensional temperature trend
• Dynamic rising section temperature curve

King Design KD-128A Vibration and shock environmental equipment

規格 Specification:

• Bottom plate size (mm) 850 x 1,260
• Testing height 300 ~ 1300 mm, 300 ~ 1800 mm, 300~ 2000 mm
• Peak Load(kg) 60 / 80 / 100
• Buffer Device Hydraulic Buffer
• Level Control Method By Line Control
• Outline Dimension (mm) 850 x 1560 x 2250, 850 x 1560 x 2750, 850 x 1560 x 2950
• Electrical Requirement 220 V 1f / 5A
• Air Pressure Requirement 6
• Weight 450(kg)

NISENE Jet ETCH Pro JEPT10 Decapsulation System

規格 Specification:

• Patented Pump
• Robust Heat Exchanger
• Safety Features
• Advanced Software
• Next-generation Technology
• Affordable
• Industry-leading Warranty
• Industry-leading Warranty
• Ease-of-Use

BCS-815 – Battery Tester – Bio-Logic Science Instruments

規格 Specification:

• Control resolution: Down to 80 nA
• Measurement resolution: Down to 20 nA (18 bit)
• Accuracy: < 0.05% of value ±0.015% of FSR < 0.1% of value ±0.015% of FSR (1 A range) < 0.3% of value ±0.04% of FSR (10 A range)

3D Stereo Microscope Keyence VHX-5000

功能 Function:

• 3D image presentation on the surface of the device

規格 Specification:

• High resolution and large depth of field
• 20-2500 magnification
• Continuous image enlargement
• Optical design of confocal point
• Working distance: 6.5mm ~ 25.5mm
• 3D image rendering

VISHAY MICRO-MEASUREMENTS LF/Z-2 Reflection Polariscope

規格 Specification:

• • Range: from 0% to 150% elongation (by various coating types)
  • Resolution: About 10 μs (for 3-min coating thickness)
  • Measuring Area: Subject to coated area
  • Working Distance: Up to 3.05 m (10 ft.)
  • Light Source: White light
  • Operating System Windos XP, Vista, Windows 7
  • Size and Weight: Max. height: 1950 mm (76.4″);
  • Assembled weight: 2.9 kg (6.3 lb)

功能 Function:

• Four-in-one new instrument of voltage source, current source, voltmeter, and ammeter, suitable for fast DC test

規格 Specification:

• Pulse Width can be as small as 150μs, resolution 1μs
• Maximum DC voltage and current 105V/1.05A, 7.35V/10A
• Maximum pulse voltage and current 100V/10.5A, 10.5V/5A
• The output voltage resolution can be as low as 5μV, and the current resolution can be as low as 50pA
• The measurement voltage resolution can be as low as 100nV, and the current resolution can be as low as 1pA
• Maximum voltage and current 105V/7A, maximum power 100W pulse voltage and current 100V/10A maximum pulse power 1KW