Arya Pratik Chandra /PhD
1.Failure Mechanism in Devices.
2.Devices Reliability.
Failure Analysis in Power Semiconductor Devices.
聯絡資訊
E-mail：arya.pratik520@gmail.com
Rajarshi Sarkar /PhD
Radiation effect on advanced semiconductor devices.
1.Density Functional Theory and VASP simulation.
2.Analysis of high energy radiation effect on semiconductor devices.
聯絡資訊
E-mail：rajarshiofficial1998@gmail.com
Hawaibam Thoithoi Singh /PhD
Analog IC Design, Cadence ADEL.
1.Radiation effect on Analog Circuits.
2.Analog Circuit Layout and Design.
3.FMCW Radar.
聯絡資訊
E-mail：thoisingh206@gmail.com
Debraj Banerjee /PhD
1.Electromigration modeling and analysis of integrated circuit using FEM.
2.Failure analysis and modeling of printed circuit board.
1.Analysis of PTH Cracks Caused by Fatigue Mechanisms Using FEA and Experimental Investigations.
2.Failure Mechanisms of CAF/PCB’s
3.EDS Reliability Testing.
4.Instrument Automation.
5.LED Reliability Testing.
聯絡資訊
E-mail：debraj19980904@gmail.com
Esha Das /PhD
Capacitor circuit analysis
Failure analysis on Capacitor
聯絡資訊
E-mail：eshadasnh@gmail.com
Jithendra Mani Kumar /Master
Lithium ion Battery
Battery Realibility
聯絡資訊
E-mail：jithendra16143@gmail.com
Surya Raju Pampothi /Master
Electrocatalyst and Material Science
Anodic Urea Oxidation Reaction (UOR)
聯絡資訊
E-mail：pampothisuryaraju@gmail.com
Anup Kshirsagar /Master
Lithium-ion Batteries, Ansys CFD, Ansys Mechanical, Electrical Power and Circuits, Power Systems.
1. Battery Pack Reliability.
2. Mechanical and Electrical Reliability via Ansys.
聯絡資訊
E-mail：npkshrsgr@gmail.com
Atharva Navanath Korade /Master
Finite Element Analysis & Solutions
1. Moisture Diffusion in PCBs
2. Crack Propagation using Ansys
聯絡資訊
E-mail：atharva20030602@gmail.com
陳柏源 /Master
Component reliability
Contributed to at CReST: Medical equipment reliability testing
聯絡資訊
E-mail：chen89730@gmail.com