Root cause analysis based maintenance policy 期刊 Journal Paper Root cause analysis based maintenance policy 閱讀全文 »
Unveiling the electromigration physics of ULSI interconnects through statistics 期刊 Journal Paper Unveiling the electromigration physics of ULSI interconnects through statistics 閱讀全文 »
The physical limit and manufacturability of power diode with carrier lifetime control 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming The physical limit and manufacturability of power diode with carrier lifetime control 閱讀全文 »
Finite element modeling of capacitive coupling voltage contrast 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Finite element modeling of capacitive coupling voltage contrast 閱讀全文 »
Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data 閱讀全文 »
Room temperature observation of point defect on gold surface using thermovoltage mapping 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Room temperature observation of point defect on gold surface using thermovoltage mapping 閱讀全文 »
Statistical analysis of multi-censored electromigration data using the EM algorithm 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming Statistical analysis of multi-censored electromigration data using the EM algorithm 閱讀全文 »
An approach to statistical analysis of gate oxide breakdown mechanisms 刊物 Publication, 會議論文 Conference Paper, 陳始明 Dr. Tan, Cher Ming An approach to statistical analysis of gate oxide breakdown mechanisms 閱讀全文 »
Feasibility study of the application of voltage contrast to printed circuit board 期刊 Journal Paper Feasibility study of the application of voltage contrast to printed circuit board 閱讀全文 »
Low temperature sol-gel intermediate layer wafer bonding 期刊 Journal Paper Low temperature sol-gel intermediate layer wafer bonding 閱讀全文 »
