可靠度科學技術研究中心 CREST, Chang Gung University > 著作 著作 Theory and Practice of Quality and Realibility Engineering in Asia Industry Electromigration Modeling at Circuit Layout Level Applications of finite Element Methods for Reliability Studies on VLSI Interconnections Simulated Annealing Information, Communication and Computing Technology Handbook of Advanced Lighting Technology Ceramic Integration and Joining Technologies Electromigration in VLSI Interconnections Integrated circuits, Photodiodes and Organic Field Effect Transistors
